Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Single-layer CNN simulator
Lee, C.-C.; de Gyvez, J.P.
Circuits and Systems, 1994. ISCAS apos;94., 1994 IEEE International Symposium on
Volume 6, Issue , 30 May-2 Jun 1994 Page(s):217 - 220 vol.6
Digital Object Identifier   10.1109/ISCAS.1994.409566
Summary:An efficient behavioral simulator for Cellular Neural Networks (CNN) is presented in this paper. The simulator is capable of performing Single-Layer CNN simulations for any size of input image, thus a powerful tool for researchers investigating potential applications of CNN. This paper reports an efficient algorithm exploiting the latency properties of Cellular Neural Networks along with numerical integration techniques; simulation results and comparisons are also presented

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at http://www.comsoc.org/.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

IEEE Article Purchase Users

Enter the username and password you received when you purchased the document. Once you access the document, you have 72 hours to download the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about becoming an IEEE Member

You are not logged in.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2006 IEEE – All Rights Reserved